CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 12618 > Article
Presentation
16 August 2023 Lens-free holographic imager with ultrahigh phase sensitivity and large field-of-view
Sebastian Haegele, Giacomo Corrielli, Matěj Hejda, Luc Dümpelmann, Roland A. Terborg, Roberto Osellame, Valerio Pruneri
Author Affiliations +
Proceedings Volume 12618, Optical Measurement Systems for Industrial Inspection XIII; 1261810 (2023) https://doi.org/10.1117/12.2673873
Event: SPIE Optical Metrology, 2023, Munich, Germany
Abstract
In this work, we present a novel design and implementation of a lens-free phase imaging system with multi-angle illumination that enhances axial resolution and image quality. The technology, which is based on a common-path shearing interferometer with phase shifting, enables ultra-high sensitivity better than 0.2 nm in optical path difference (OPD), while operating over a wide FoV (>10 mm²) and a large volume (>10 mm³). We show results in several applications, from surface topographies to volumetric structures, including imaging of 10 nm thin transparent topographies and of volumetric laser-written refractive index structures in glass. The high sensitivity and low noise make the proposed technology ideally suited for imaging of low contrast structures on the surface or inside transparent materials, such as defects, impurities, or changes in refractive index.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Sebastian Haegele, Giacomo Corrielli, Matěj Hejda, Luc Dümpelmann, Roland A. Terborg, Roberto Osellame, and Valerio Pruneri "Lens-free holographic imager with ultrahigh phase sensitivity and large field-of-view", Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 1261810 (16 August 2023); https://doi.org/10.1117/12.2673873
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 PRESENTATION
WATCH
PRESENTATION SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
KEYWORDS
Imaging systems
Holograms
Holography
Optical path differences
Phase imaging
Refractive index
Resolution enhancement technologies
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top