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1 August 1990 Optical coverings in modulators and deflectors in far-IR range
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Proceedings Volume 1274, Electro-Optic and Magneto-Optic Materials II; (1990)
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands
In far IR range the reflection and transparency characteristics o semiconductors are determined. by tree carriers plasma, its dielectric permittivity being determined. by pulse relaxation time c. The parameter depends on external electromagnetic flelcls,that allows to control the reflection radiation parameters. It's important,that this method permits one to obtain high mod.ulat ion frequency ( 1 Hz ). Optical coating of semiconductor surface allows to extend essentially the possibilities of such control, e.g. to increase the modulation depth. In this paper conditions o1 the absence o reflection 1or the given T are derived.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Iosif N. Sisakian, Alexander V. Tikhonravov, Alexander V. Shvartsburg, and Andrew V. Shepelev "Optical coverings in modulators and deflectors in far-IR range", Proc. SPIE 1274, Electro-Optic and Magneto-Optic Materials II, (1 August 1990);

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