Expert system for geologic mapping with imaging spectrometers

Fred A. Kruse; Olivier Seznec; P. M. Krotkov

doi:10.1117/12.21142

1 January 1990 Expert system for geologic mapping with imaging spectrometers

Fred A. Kruse, Olivier Seznec, P. M. Krotkov

Proceedings Volume 1293, Applications of Artificial Intelligence VIII; (1990) https://doi.org/10.1117/12.21142
Event: 1990 Technical Symposium on Optics, Electro-Optics, and Sensors, 1990, Orlando, FL, United States

Abstract

Techniques have been developed for the extraction and characterization of absorption features from visible and infrared reflectance spectra and an expert system has been designed, implemented, and successfully tested that allows automated identification of minerals based on their spectral characteristics. A suite of laboratory spectra of common minerals was analyzed and the absorption band characteristics tabulated and used to develop a generalized knowledge base for analysis of the reflectance spectra. A tree hierarchy was designed to emulate the decision process followed by an experienced analyst for analysis of laboratory and field reflectance spectra and aircraft imaging spectrometer spectra. Good results were obtained with the expert system for all three types of spectra, with the critical factor in the analysis being the signal-to-noise ratio of the spectral data.

Citation Download Citation

Fred A. Kruse, Olivier Seznec, and P. M. Krotkov "Expert system for geologic mapping with imaging spectrometers", Proc. SPIE 1293, Applications of Artificial Intelligence VIII, (1 January 1990); https://doi.org/10.1117/12.21142

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