The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), “Title of Paper,” in International Conference on Optical and Photonic Engineering (icOPEN 2023), edited by Haixia Wang, Fang Cheng, Cuong Dang, Aaron Danner, Qian Kemao, Proc. of SPIE 13069, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL). ISSN: 0277-786X ISSN: 1996-756X (electronic) ISBN: 9781510674561 ISBN: 9781510674578 (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time) SPIE.org Copyright © 2024 Society of Photo-Optical Instrumentation Engineers (SPIE). Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of fees. To obtain permission to use and share articles in this volume, visit Copyright Clearance Center at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. Printed in the United States of America by Curran Associates, Inc., under license from SPIE. Publication of record for individual papers is online in the SPIE Digital Library.
 Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows: ▪ The first five digits correspond to the SPIE volume number. ▪ The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.
Conference CommitteeGeneral Chair Co-chairs Qian Kemao, Nanyang Technological University (Singapore) Fang Cheng, Advanced Remanufacturing and Technology Centre, A*STAR (Singapore) Cuong Dang, Nanyang Technological University (Singapore) Aaron Danner, National University of Singapore (Singapore) Haixia Wang, Zhejiang University of Technology (China)
Session Chairs 1 Plenary 1: Testing Optics with Interferometry and Tunable-Wavelength Lasers Fang Cheng, Advanced Remanufacturing and Technology Centre, A*STAR (Singapore) 2 Plenary 2: Digital Holographic Metrology for Imaging Acoustics and Vibrations Fang Cheng, Advanced Remanufacturing and Technology Centre, A*STAR (Singapore) 3 Plenary 3: Publishing in Nature Journals Chao Zuo, Nanjing University of Science and Technology (China) 4 Plenary 4: Advances in High-Accuracy Three-Dimensional Dynamic Deformation Measurement and its Applications for Large Structures Chao Zuo, Nanjing University of Science and Technology (China) 5 Keynote 1: Specular Surface Shape Measurement with Collimated Phase Measuring Deflectometry Cuong Dang, Nanyang Technological University (Singapore) 6 Keynote 2: The Slope Deflectometry System Development for Three-Dimensional Profile Measurement Cuong Dang, Nanyang Technological University (Singapore) 7 Keynote 3: Sub-10 nm Focusing of Hard X-ray Free-Electron Laser for Reaching 1022 W/cm2 Intensity Cuong Dang, Nanyang Technological University (Singapore) 8 Keynote 4: Three-Dimensional Shape Measurement of Diffused/Specular Surface by Combining Fringe Projection Profilometry and Phase Measuring Deflectometry Haixia Wang, Zhejiang University of Technology (China) 9 Keynote 5: Quantitative Phase Microscopy and Phase Correlation Spectroscopy for Biology Haixia Wang, Zhejiang University of Technology (China) 10 Keynote 6: Research on Single Pixel Imaging Method for Moving Object Haixia Wang, Zhejiang University of Technology (China) 11 SS1: 2D, 3D and Volumetric Digital Image Correlation and their Applications Zhenyu Jiang, South China University of Technology (China) 12 SS2: 3D Shape Measurement Based on Fringe Projection Dongliang Zheng, Nanjing University of Science and Technology (China) 13 SS3: Advances in Digital Holography Techniques Peng Gao, Xidian University (China) 14 SS4: Advances in Moiré Method and its Applications Hongye Zhang, Beijing Forestry University (China) 15 SS7: High-Accuracy Optical Deformation Measurement of Large Engineering Structures Xinxing Shao, Southeast University (China) Qinwei Ma, Beijing Institute of Technology (China) 16 SS8: High-Precision Optical Measurement Xiangchao Zhang, Fudan University (China) 17 SS9: Imaging Through Scattering Media and Non-line-of-sight Imaging Jing Han, Nanjing University of Science and Technology (China) 18 SS10: Industrial Optical Inspection and Non-Destructive Testing (NDT) Joseph Lifton, Advanced Remanufacturing and Technology Center (Singapore) Tong Liu, Singapore Institute of Manufacturing Technology (Singapore) 19 SS12: Micro/Nano-Mechanical Measurement and Characterization by Optical/Spectral Methods Wei He, Hunan University (China) 20 SS13: Optical Dynamic Measurement Yu Fu, Shenzhen University (China) 21 SS14: Optical Measurement and Instrumentation Yingjie Yu, Shanghai University (China) 22 SS15: Quantitative Phase Imaging Chao Zuo, Nanjing University of Science and Technology (China) 23 SS16: Single-Pixel Imaging and Optical Encoding Wen Chen, Hong Kong Polytechnic University (China) 24 SS17: Infrared Thermography and Structural Health Monitoring Hongye Zhang, Beijing Forestry University (China) 25 SS18: X-ray Optics and Metrology Lei Huang, Brookhaven National Laboratory (United States) Jumpei Yamada, Osaka University (Japan) 26 SS19: Optical Engineering in Industry QiongHua Wang, Beihang University (China) 27 GT1: 3D Image Acquisition and Display Wen Chen, Hong Kong Polytechnic University (China) 28 GT2: Biomedical Optics and Imaging Yongtao Liu, Nanjing University of Science and Technology (China) 29 GT3: Computer Vision Techniques Yongtao Liu, Nanjing University of Science and Technology (China) 30 GT6: Image Processing and Deep Learning Liyong Ren, Shaanxi Normal University (China) 31 GT9: Non-Destructive Testing and Inspection Chenxing Wang, Southeast University (China) 32 GT10: Optical Component and System Simulation Zhenyu Jiang, South China University of Technology (China) 33 GT11: Optical Functional Materials and Devices Chenxing Wang, Southeast University (China) 34 GT12: Optical Measurement Methods Satoru Yoneyama, Aoyama Gakuin University (Japan) Fujun Yang, Southeast University (China) 35 GT13: Quantitative Phase Imaging Liangcai Cao, Tsinghua University (China) 36 GT15: Ultrafast Lasers and Applications Zhenyu Jiang, South China University of Technology (China) 37 GT16: Other Related Topics QiongHua Wang, Beihang University (China)
Special Session Organizers 1 SS1: 2D, 3D and Volumetric Digital Image Correlation and their Applications Zhenyu Jiang, South China University of Technology (China) 2 SS2: 3D Shape Measurement based on Fringe Projection Dongliang Zheng, Nanjing University of Science and Technology (China) 3 SS3: Advances in Digital Holography Techniques Jianglei Di, Guangdong University of Technology (China) 4 SS4: Advances in Moiré Method and its Applications Hongye Zhang, Beijing Forestry University (China) Xianfu Huang, Institute of Mechanics, Chinese Academy of Sciences (China) 5 SS7: High-Accuracy Optical Deformation Measurement of Large Engineering Structures Xinxing Shao, Southeast University (China) Banglei Guan, National University of Defense Technology (China) Qinwei Ma, Beijing Institute of Technology (China) 6 SS8:High-Precision Optical Measurement Jing Xu, Tsinghua University (China) Xiangchao Zhang, Fudan University (China) Wenlong Lu, Huazhong University of Science and Technology (China) 7 SS9: Imaging through Scattering Media and Non-line-of-sight Imaging Jing Han, Nanjing University of Sciences and Technology (China) 8 SS10: Industrial Optical Inspection and Non-Destructive Testing (NDT) Andrew Alexander Malcolm, Advanced Remanufacturing and Technology Center (Singapore) Joseph Lifton, Advanced Remanufacturing and Technology Center (Singapore) 9 SS12: Micro/Nano-Mechanical Measurement and Characterization of Optical/Spectral Methods Mengxiong Liu, Peking University (China) Haimei Xie, Tianjin University (China) Xide Li, Tsinghua University (China) 10 SS13: Optical Dynamic Measurement Yu Fu, Shenzhen University (China) 11 SS14: Optical Measurement and Instrumentation Yingjie Yu, Shanghai University (China) 12 SS15: Quantitative Phase Imaging Chao Zuo, Nanjing University of Science and Technology (China) 13 SS16: Single-Pixel Imaging and Optical Encoding Wen Chen, The Hong Kong Polytechnic University (China) Zibang Zhang, Jinan University (China) 14 SS17: Infrared Thermography and Structural Health Monitoring and Evaluation Jianguo Zhu, Jiangsu University (China) Dan Wu, Ningbo University(China) 15 SS18: X-ray Optics and Metrology Lei Huang, Brookhaven National Laboratory (United States) 16 SS19: Optical Engineering in Industry Anand Asundi, d’Optron Pte Ltd. (Singapore) Xiang Peng, Shenzhen University (China) and Shenzhen Anhua Optoelectronics Technology Company Ltd. (China)
|
