Easy focusing with a sweep frequency target

Gerald C. Holst; Stephen W. McHugh

doi:10.1117/12.21782

1 October 1990 Easy focusing with a sweep frequency target

Gerald C. Holst, Stephen W. McHugh

Proceedings Volume 1309, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing; (1990) https://doi.org/10.1117/12.21782
Event: 1990 Technical Symposium on Optics, Electro-Optics, and Sensors, 1990, Orlando, FL, United States

Abstract

Methods for focusing thermal imaging systems are discussed including visual inspection of resolution targets and edges, maximizing the system response to slits or periodic targets, maximizing the response at a particular spatial frequency, and maximizing the output of an edge detection algorithm. Visual inspection of a sweep frequency is found to be the most efficient method for determining focus in raster scanned systems.

Citation Download Citation

Gerald C. Holst and Stephen W. McHugh "Easy focusing with a sweep frequency target", Proc. SPIE 1309, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing, (1 October 1990); https://doi.org/10.1117/12.21782

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