Principle and demonstration of novel pointing direction metrology system for high-resolution x-ray imaging

Leo Terada; Ikuyuki Mitsuishi; Yoichi Yatsu

doi:10.1117/12.3020852

21 August 2024 Principle and demonstration of novel pointing direction metrology system for high-resolution x-ray imaging

Leo Terada, Ikuyuki Mitsuishi, Yoichi Yatsu

Author Affiliations +

Proceedings Volume 13093, Space Telescopes and Instrumentation 2024: Ultraviolet to Gamma Ray; 130935M (2024) https://doi.org/10.1117/12.3020852
Event: SPIE Astronomical Telescopes + Instrumentation, 2024, Yokohama, Japan

Conference Poster

Abstract

This study presents a novel pointing direction metrology system that enables the acquisition of X-ray images with high spatial resolution. The principle of this system is that the pointing direction of the X-ray detector is determined directly by mapping its position to the celestial coordinate system using the optical conjugate of the X-ray telescope. In this system, visible light sources are placed around the X-ray detector. The light from these sources is projected onto the celestial sphere by an X-ray telescope, and a dedicated built-in star tracker (STT) creates optical images of the actual stars and projected images of the light sources. The STT can be employed to determine the position of the projected sources in celestial coordinates and the detector's field of view on the celestial sphere. The proposed method can eliminate uncertainties associated with the telescope mirror and the supporting structures. This study also discusses the results of demonstration experiments.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

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Leo Terada, Ikuyuki Mitsuishi, and Yoichi Yatsu "Principle and demonstration of novel pointing direction metrology system for high-resolution x-ray imaging", Proc. SPIE 13093, Space Telescopes and Instrumentation 2024: Ultraviolet to Gamma Ray, 130935M (21 August 2024); https://doi.org/10.1117/12.3020852

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