Presentation + Paper
30 September 2024 Key aspects of sub-nanometer deterministic ion beam figuring for synchrotron hard x-ray mirror fabrication
Tianyi Wang, Lei Huang, Yi Zhu, Nathalie Bouet, Corey Austin, Mourad Idir
Author Affiliations +
Abstract
Achieving sub-nanometer precision in ion beam figuring (IBF) processes demands a comprehensive understanding and optimization of various key aspects, including metrology, dwell time optimization, velocity scheduling, positioning, and final inspection. In this study, these aspects are analyzed and discussed. Our solutions for the challenges in each aspect are highlighted, with implications for a wide range of applications requiring ultra-precise optical components.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Tianyi Wang, Lei Huang, Yi Zhu, Nathalie Bouet, Corey Austin, and Mourad Idir "Key aspects of sub-nanometer deterministic ion beam figuring for synchrotron hard x-ray mirror fabrication", Proc. SPIE 13134, Optical Manufacturing and Testing 2024, 131340K (30 September 2024); https://doi.org/10.1117/12.3027640
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KEYWORDS
Mirrors

Ion beam finishing

Mathematical optimization

Ion beams

Fabrication

Hard x-rays

X-rays

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