Determination of the refractive-index tensor by bireflectance in biaxial crystals

Haim Lotem; Zeev Burshtein

doi:10.1117/12.22082

1 October 1990 Determination of the refractive-index tensor by bireflectance in biaxial crystals

Haim Lotem, Zeev Burshtein

Proceedings Volume 1317, Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray; (1990) https://doi.org/10.1117/12.22082
Event: Polarimetry '90, 1990, Huntsville, AL, United States

Abstract

The bireflectance effect is observed when a light beam is internally reflected in an anisotropic material. Generally, an unpolarized light beam splits into four beams on reflection. A new method for simultaneous measurement of the three refractive indices, in a single piece of a sample, via bireflectance, is demonstrated in the biaxial CdWO₄ crystal. The three principal refractive indices of CdWO₄ were obtained in the visible range. At λ = 633 nm, n_X = 2.09±0.01, n_Y - n_X = 0.052±0.001, and n_Z - n_X = 0.114±0.002.

Citation Download Citation

Haim Lotem and Zeev Burshtein "Determination of the refractive-index tensor by bireflectance in biaxial crystals", Proc. SPIE 1317, Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray, (1 October 1990); https://doi.org/10.1117/12.22082

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