Polarization properties of nonsymmetric retroreflectors

Chang-Hyuk An; John W. Morris

doi:10.1117/12.22069

1 October 1990 Polarization properties of nonsymmetric retroreflectors

Chang-Hyuk An, John W. Morris

Proceedings Volume 1317, Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray; (1990) https://doi.org/10.1117/12.22069
Event: Polarimetry '90, 1990, Huntsville, AL, United States

Abstract

The on- and off-axis polarizing properties of asymmetric retroreflectors are studied in detail for various angles of incidence and for various incident linear polarization states. An analytic model is developed by applying Fresnel law to the incident and reflecting radiation on each facet of the retroreflector. It is shown that the polarization state of retroreflected radiation is a sensitive function of incident angle, incident polarization rate, and retroreflector material. These characteristics may be applicable to the determination of the relative angular position between the retroreflector and the analyzer.

Citation Download Citation

Chang-Hyuk An and John W. Morris "Polarization properties of nonsymmetric retroreflectors", Proc. SPIE 1317, Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray, (1 October 1990); https://doi.org/10.1117/12.22069

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