Paper
1 December 1990 Thermal properties of optical thin-film materials
Donald L. Decker
Author Affiliations +
Abstract
A survey of experimental methods and data for thin-film thermal conductivity and heat capacity is given. Simple microscopic theory is provided as a basis for understanding the very small values of thin-film thermal conductivity observed. Interfacial resistance effects, including some conjecture on origins, as well as applications of thermal property data are discussed. The needs for future development of this important area of investigation are summarized, and some suggestions for emphasis are provIded.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald L. Decker "Thermal properties of optical thin-film materials", Proc. SPIE 1323, Optical Thin Films III: New Developments, (1 December 1990); https://doi.org/10.1117/12.22394
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CITATIONS
Cited by 14 scholarly publications.
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KEYWORDS
Thin films

Resistance

Thermography

Metals

Interfaces

Dielectrics

Diffusion

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