Modeling the properties of unbacked thin films

John O. Stoner Jr.

doi:10.1117/12.22434

1 December 1990 Modeling the properties of unbacked thin films

John O. Stoner Jr.

Proceedings Volume 1324, Modeling of Optical Thin Films II; (1990) https://doi.org/10.1117/12.22434
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Thin films are used as coatings and filters on solid substrates in optics, condensed-matter physics, and many other fields. Ballistic-aggregation simulations have served well to explain the properties of such films and to suggest methods for their improvement. Thin films are also widely used without backings, as self-supporting structures. We have used simulations to advantage in the modeling of such components. To explain some of their properties, 3-D modeling is essential and a simple modeling program is adequate. Our studies using both 2-D and 3-D methods explain qualitatively the tendency of such films to curl, the directional character of that curling, the differing x-ray reflectance from the two sides of such a film, and the variation of mechanical and other properties upon position in a large film.

Citation Download Citation

John O. Stoner Jr. "Modeling the properties of unbacked thin films", Proc. SPIE 1324, Modeling of Optical Thin Films II, (1 December 1990); https://doi.org/10.1117/12.22434

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