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1 December 1990 Infrared measurements of CVD diamond films
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Abstract
The growth surfaces of CVD diamond films are usually rough with polycrystalline crystallographic habits which presents a severe problem if CVD diamond films are to be used in infrared optics. Several methods are described in this paper in an effort to solve this problem. A polishing process was used to reduce the surface roughness by polishing the rough growth surface with a heated cast iron scaife. For polished films, near 70% transmittance was obtained over the whole range of 600-4000 cm-1, while the transmittance for non-polished films were much lower and varied strongly with the wavenumber. Absorptions believed due to carbon-hydrogen stretching bands and a silicon carbide phase were observed in the transmission spectra of polished diamond films.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiao-Hong Wang, Lawrence J. Pilione, Wei Zhu, Walter A. Yarbrough, W. R. Drawl, and Russell F. Messier "Infrared measurements of CVD diamond films", Proc. SPIE 1325, Diamond Optics III, (1 December 1990); https://doi.org/10.1117/12.22455
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