Optical characterization of polycrystalline diamond films

M. Alfred Akerman; Joseph R. McNeely; Robert E. Clausing

doi:10.1117/12.22457

1 December 1990 Optical characterization of polycrystalline diamond films

M. Alfred Akerman, Joseph R. McNeely, Robert E. Clausing

Proceedings Volume 1325, Diamond Optics III; (1990) https://doi.org/10.1117/12.22457
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Infrared transmission reflection and scatter of freestanding polycrystallin diamond films have been measured. Raman spectra have also been obtained. Films with microcrystalline as well as (1 1 1 ) and (1 00) faces exposed are compared using scanning electron microg raphs . Altered gas mixtures anc temperature of substrate cause changes in surface microstructure and will bE discussed in regard to the effect on optical properties. 1 .

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M. Alfred Akerman, Joseph R. McNeely, and Robert E. Clausing "Optical characterization of polycrystalline diamond films", Proc. SPIE 1325, Diamond Optics III, (1 December 1990); https://doi.org/10.1117/12.22457

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