High-temperature ADC peripheral circuit design and system performance testing

Zhenyu Lin; Xiaodong Cao

doi:10.1117/12.3033400

16 October 2024 High-temperature ADC peripheral circuit design and system performance testing

Zhenyu Lin, Xiaodong Cao

Author Affiliations +

Proceedings Volume 13291, Ninth International Symposium on Advances in Electrical, Electronics, and Computer Engineering (ISAEECE 2024); 1329118 (2024) https://doi.org/10.1117/12.3033400
Event: Ninth International Symposium on Advances in Electrical, Electronics, and Computer Engineering (ISAEECE 2024), 2024, Changchun, China

Abstract

To validate the conversion performance of ADC at different temperatures, the demand for components in wide-temperature application systems is addressed by selecting high-reliability system components. This ensures stable operation of the analog-to-digital converter module across various temperatures, particularly in high-temperature environments. To achieve high-precision analog-to-digital conversion in wide-temperature environments, the ADC peripheral driving circuit is designed and optimized to guarantee signal acquisition accuracy, stability, and immunity to interference. In the experimental section, a high-temperature ADC performance testing system is constructed based on this analog-to-digital conversion module. The dynamic performance of the 12-bit ADC is evaluated using FFT spectrum analysis. Experimental results demonstrate that the effective number of bits of the ADC exceeds 10 bit within the temperature range of -40°C to 250°C, indicating excellent conversion performance of the ADC and high reliability of the peripheral circuit. Implementation of the high-temperature ADC performance testing system also provides valuable reference for constructing signal acquisition systems based on high-temperature ADC in practical high-temperature application scenarios.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Zhenyu Lin and Xiaodong Cao "High-temperature ADC peripheral circuit design and system performance testing", Proc. SPIE 13291, Ninth International Symposium on Advances in Electrical, Electronics, and Computer Engineering (ISAEECE 2024), 1329118 (16 October 2024); https://doi.org/10.1117/12.3033400

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KEYWORDS

Analog to digital converters

Analog electronics

Reliability

Data conversion

Signal processing

Thermal stability

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