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2 June 1978 Background Spectral Radiance And Contrast In The 1.5 TO 13 Micrometer Region
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Proceedings Volume 0133, Optics in Missile Engineering; (1978) https://doi.org/10.1117/12.956069
Event: 1978 Los Angeles Technical Symposium, 1978, Los Angeles, United States
Abstract
Spectral measurement instrumentation for the study of absolute radiance and contrast in the 1.5 to 13 micrometer region has been fabricated. Measurement technology has been developed based on fifteen years of experience. Spectral measurement instrumentation and techniques are discussed, including calibration methods, data acquisition and data reduction. Examples of recent natural background spectra are presented in both absolute and contrast forms.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William A. Dias Jr. "Background Spectral Radiance And Contrast In The 1.5 TO 13 Micrometer Region", Proc. SPIE 0133, Optics in Missile Engineering, (2 June 1978); https://doi.org/10.1117/12.956069
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