Paper
5 December 2024 Accurate high-frequency measurement of electro-optic phase modulators based on optical spectrum analysis and microwave fixture de-embedding
Simou Wang, Chao Jing, Ying Xu, Junfeng Zhu, Xinhai Zou, Shangjian Zhang
Author Affiliations +
Proceedings Volume 13418, Fifteenth International Conference on Information Optics and Photonics (CIOP 2024); 134180F (2024) https://doi.org/10.1117/12.3044688
Event: 15th International Conference on Information Optics and Photonics (CIOP2024), 2024, Xi’an, China
Abstract
High-speed electro-optic Phase Modulators (PMs) are critical devices in microwave photonics and optical communication. Optical spectrum analysis is widely used to measure the modulation depth of PMs thanks to simple structure and wide measurement frequency range. To further obtain the accurate frequency response especially the half-wave voltage of PMs, the microwave driving power input to the electrical port of PMs must be measured accurately. However, the source adapter network such as coaxial cables and connectors for connecting the microwave source and the PM under test will result in degraded response, which should be de-embedded. In this study, an improved optical spectrum analysis method is proposed to measure the frequency response of PMs based on microwave fixture de-embedding. In the proposed scheme, the microwave power transmitted from the microwave source to the PM is investigated by using signal flow graph to track the accurate driving power input to the PM, including transmission attenuation and impedance mismatch of the source adapter network and the PM. The accurate frequency response including modulation depth, half-wave voltage and relative response of the PM are obtained. In a proof-of-concept experiment, a commercial PM has been accurately measured in the frequency range of 1–30 GHz to demonstrate the feasibility of the proposed method. Our method fully calibrates the microwave power loss and the port impedance mismatch, which is applicable for those PMs even without good impedance match. Moreover, our method features simple structure and broadband measurement thanks to the optical spectrum analysis scheme.
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Simou Wang, Chao Jing, Ying Xu, Junfeng Zhu, Xinhai Zou, and Shangjian Zhang "Accurate high-frequency measurement of electro-optic phase modulators based on optical spectrum analysis and microwave fixture de-embedding", Proc. SPIE 13418, Fifteenth International Conference on Information Optics and Photonics (CIOP 2024), 134180F (5 December 2024); https://doi.org/10.1117/12.3044688
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KEYWORDS
Phase modulation

Microwave radiation

Spectrum analysis

Frequency response

Electrooptic modulators

Electrooptics

Modulation

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