Hard x-ray polarimeter utilizing Compton scattering

Hirohisa Sakurai; Motosaku Noma; H. Niizeki

doi:10.1117/12.23225

1 February 1991 Hard x-ray polarimeter utilizing Compton scattering

Hirohisa Sakurai, Motosaku Noma, H. Niizeki

Proceedings Volume 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography; (1991) https://doi.org/10.1117/12.23225
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

A prototype polarimeter with a 50 mm diameter has been constructed. With polarized x-rays from a simple polarizer, the detection efficiency and modulation factor of the polarimeter with a 40 mm thick scatterer were 3.2% and 0.57%, respectively, at 60 keV. The fabrication and performance of the polarimeter and polarizer are presented.

Citation Download Citation

Hirohisa Sakurai, Motosaku Noma, and H. Niizeki "Hard x-ray polarimeter utilizing Compton scattering", Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); https://doi.org/10.1117/12.23225

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available