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1 February 1991 Hard x-ray polarimeter utilizing Compton scattering
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Abstract
A prototype polarimeter with a 50 mm diameter has been constructed. With polarized x-rays from a simple polarizer, the detection efficiency and modulation factor of the polarimeter with a 40 mm thick scatterer were 3.2% and 0.57%, respectively, at 60 keV. The fabrication and performance of the polarimeter and polarizer are presented.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hirohisa Sakurai, Motosaku Noma, and H. Niizeki "Hard x-ray polarimeter utilizing Compton scattering", Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); https://doi.org/10.1117/12.23225
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