Dynamic measurement method for indoor large-scale standard device based on dual laser trackers

Chang'an Hu; Shenmin Huang; Xingxing Li; Dongjing Miao; Fei Lv

doi:10.1117/12.3055342

12 December 2024 Dynamic measurement method for indoor large-scale standard device based on dual laser trackers

Chang'an Hu, Shenmin Huang, Xingxing Li, Dongjing Miao, Fei Lv

Proceedings Volume 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024); 1343904 (2024) https://doi.org/10.1117/12.3055342
Event: Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 2024, Xiamen, China

Abstract

In order to solve the dynamic synchronization problem of two laser trackers, two laser trackers are used in this paper, equipped with two measurement target balls placed on a large indoor standard device platform. By moving the platform at a constant speed at a certain measurement distance, the dynamic measurement distance between the two target balls and the speed of the platform during the dynamic condition are analyzed. The following conclusions are drawn: In synchronous measurement, when the sampling frequency of the two laser trackers is set to 50Hz, the maximum value of the speed difference between the platforms during the uniform speed stage is 3.1μm/s. When the sampling frequency of the two laser trackers is set to 10Hz, 20Hz, and 50Hz, the maximum relative distance between the two target balls is 1.778mm, 1.765mm, and 1.764mm respectively. The measurement method used in this paper can be further studied in dynamic synchronous measurement through certain transformations, and up to five laser trackers can be connected for synchronous measurement, which has great application prospects.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Chang'an Hu, Shenmin Huang, Xingxing Li, Dongjing Miao, and Fei Lv "Dynamic measurement method for indoor large-scale standard device based on dual laser trackers", Proc. SPIE 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 1343904 (12 December 2024); https://doi.org/10.1117/12.3055342

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