Paper
12 December 2024 Analysis of influence of porosity on electric field and temperature in pre-insertion resistors
Yanyan Bao, Kang Liu, Yushuo Wu, Bodong Chen, Yongliang Yao, Ruoyu Wang
Author Affiliations +
Proceedings Volume 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024); 134390I (2024) https://doi.org/10.1117/12.3055490
Event: Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 2024, Xiamen, China
Abstract
In UHV and UHV transmission lines, tank circuit breakers need to be switched frequently, and the pre-insertion resistors is subject to the mixed impact of AC and DC at the same time, so the pre-insertion resistors is easy to be damaged, which affects the reliability of the power system. The pre-insertion resistors needs to withstand a lot of heat when acting, and the temperature distribution and heat dissipation capacity inside the pre-insertion resistors are particularly important. Based on this, this study first observed the internal morphology of the pre-insertion resistors through electron microscopy, established a Voronoi diagram model according to the internal morphology, built a simulation model of the pre-insertion resistors and calculated the temperature and electric field distribution of the pre-insertion resistors under different porosity. The results show that after injection of impulse current pulse with peak value of 2.03kA, the highest temperature inside the pre-insertion resistors at 366.5°C appears at the pore next to the carbon black conductive chain. Higher rate of porosity will make the temperature inside the pre-insertion resistors more evenly distributed, but will bring about an increase in the strength of the overall electric field inside.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Yanyan Bao, Kang Liu, Yushuo Wu, Bodong Chen, Yongliang Yao, and Ruoyu Wang "Analysis of influence of porosity on electric field and temperature in pre-insertion resistors", Proc. SPIE 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 134390I (12 December 2024); https://doi.org/10.1117/12.3055490
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KEYWORDS
Resistors

Porosity

Electric fields

Electrical conductivity

Temperature distribution

Crystals

Scanning electron microscopy

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