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1 November 1990 Metric nonlinearities of microchannel plate detectors
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Abstract
Metric nonlinearities in microchannel plate detectors have been mapped using a small spot of UV light scanned across the detector. The centroid of the detected image is accurately located, and corrections to the wavelength scale are made to determine the precise absolute Doppler shifts of the solar emission lines. The possible causes of the observed nonlinearities are briefly discussed.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald M. Hassler, Gary J. Rottman, and George M. Lawrence "Metric nonlinearities of microchannel plate detectors", Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); https://doi.org/10.1117/12.23251
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