Paper
19 December 2024 Research on reuse method of electronic product debugging process knowledge based on ontology model
Wen Lei
Author Affiliations +
Proceedings Volume 13444, Fifth International Conference on Mechanical Engineering, Intelligent Manufacturing, and Mechatronics (MEIMM 2024); 134440L (2024) https://doi.org/10.1117/12.3056119
Event: The 5th International Conference on Mechanical Engineering, Intelligent Manufacturing, and Mechatronics, 2024, Guilin, China
Abstract
Existing methods in electronic product debugging processes often suffer from low standardization and design efficiency. To address these shortcomings, our proposed method combines ontology technology and semantic reasoning technology. By constructing a standardized electronic product debugging process ontology model and utilizing SWRL (Semantic Web Rule Language) rules, we enhance reasoning capabilities and facilitate knowledge reuse. The integration of the Drools inference engine further improves the efficiency of the debugging process design. The research results demonstrate a significant improvement in the efficiency of debugging process design and a reduction in manual input. Through the utilization of the proposed method, the inference outcomes are generated efficiently, enabling the reuse of process knowledge. This study highlights the importance of ontology modeling and SWRL rules in enhancing the efficiency and effectiveness of electronic product debugging processes.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Wen Lei "Research on reuse method of electronic product debugging process knowledge based on ontology model", Proc. SPIE 13444, Fifth International Conference on Mechanical Engineering, Intelligent Manufacturing, and Mechatronics (MEIMM 2024), 134440L (19 December 2024); https://doi.org/10.1117/12.3056119
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KEYWORDS
Design

Semantics

Equipment

Standards development

Analog electronics

Signal processing

Modeling

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