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12 December 2024 Overview of defect detection techniques for high-voltage cable insulation layer materials
Xingjian Zhang, Hao Ni, Yue Zou, Ting Chen
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Proceedings Volume 13446, Sixth International Conference on Optoelectronic Science and Materials (ICOSM 2024); 134460X (2024) https://doi.org/10.1117/12.3052603
Event: 6th International Conference on Optoelectronic Science and Materials (ICOSM 2024), 2024, Hefei, China
Abstract
High-voltage cable laying volume increases year by year is the inevitable trend brought about by the development. The insulation performance of the cable insulation layer reacts to whether the cable meets the standard, so the testing of the insulation layer material has an important significance on the safe and stable operation of the cable. This paper first introduces the structure of the cable and the main analysis methods of the insulation layer, focusing on the spectral method. Secondly, this paper summarizes the system structure of infrared spectroscopy in the application of cable insulation layer and the current level of technology. Finally, this paper describes the main problems of the current application of infrared spectroscopy in the cable insulation layer. In summary, infrared spectroscopy has a broad application prospect in cable insulation detection.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Xingjian Zhang, Hao Ni, Yue Zou, and Ting Chen "Overview of defect detection techniques for high-voltage cable insulation layer materials", Proc. SPIE 13446, Sixth International Conference on Optoelectronic Science and Materials (ICOSM 2024), 134460X (12 December 2024); https://doi.org/10.1117/12.3052603
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KEYWORDS
Infrared spectroscopy
Infrared radiation
Dielectrics
Absorbance
Spectroscopy
Defect detection
Molecules
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