Measurements with a 35-psec gate time microchannel plate camera

Perry M. Bell; Joseph D. Kilkenny; Roy L. Hanks; Otto L. Landen

doi:10.1117/12.23371

1 January 1991 Measurements with a 35-psec gate time microchannel plate camera

Perry M. Bell, Joseph D. Kilkenny, Roy L. Hanks, Otto L. Landen

Proceedings Volume 1346, Ultrahigh- and High-Speed Photography, Videography, Photonics, and Velocimetry '90; (1991) https://doi.org/10.1117/12.23371
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Measurements of the x-ray gate time of 0. 2 mm thick microchannel plates with an LID aspect ratio of 20 as opposed to the more usual L/D demonstrate that gate times of 35 PS can be achieved. Good agreement with time dependent modelling is demonstrated L

Citation Download Citation

Perry M. Bell, Joseph D. Kilkenny, Roy L. Hanks, and Otto L. Landen "Measurements with a 35-psec gate time microchannel plate camera", Proc. SPIE 1346, Ultrahigh- and High-Speed Photography, Videography, Photonics, and Velocimetry '90, (1 January 1991); https://doi.org/10.1117/12.23371

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