Microwave holographic metrology for antenna diagnosis

Yahya Rahmat-Samii

doi:10.1117/12.23638

1 November 1990 Microwave holographic metrology for antenna diagnosis

Yahya Rahmat-Samii

Proceedings Volume 1351, Digital Image Synthesis and Inverse Optics; (1990) https://doi.org/10.1117/12.23638
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Advances in antenna diagnostic methodologies have been very significant in recent years. In particular, microwave holographic diagnostic techniques have been applied very successfully in improving the performance of reflector and array antennas. These techniques use the knowledge of the measured amplitude and phase of the antenna radiated fields and then take advantage of the existing Fourier transform relationships between the radiated fields and the effective aperture or current distribution to eventually determine the reflector surface or array excitation coefficients anomalies. In this paper an overview of the recent developments in applying microwave holography is presented. The theoretical, numerical and measurement aspects of this technique is detailed by providing representative results.

Citation Download Citation

Yahya Rahmat-Samii "Microwave holographic metrology for antenna diagnosis", Proc. SPIE 1351, Digital Image Synthesis and Inverse Optics, (1 November 1990); https://doi.org/10.1117/12.23638

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