Measurement of the sizes of the semiconductor crystallites in colored glasses through neutron scattering

Gian Piero Banfi; Vittorio Degiorgio; A. R. Rennie; Giancarlo C. Righini

doi:10.1117/12.24307

1 March 1991 Measurement of the sizes of the semiconductor crystallites in colored glasses through neutron scattering

Gian Piero Banfi, Vittorio Degiorgio, A. R. Rennie, Giancarlo C. Righini

Proceedings Volume 1361, Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization; (1991) https://doi.org/10.1117/12.24307
Event: Physical Concepts of Materials for Novel Optoelectronic Device Applications, 1990, Aachen, Germany

Abstract

Semiconductor doped glasses have been studied by small angle neutron scattering. The results allow a precise determination of the average size of the microcrystallites and to evidence the volume depleted of semiconductor costituents that sorrounds each particle

Citation Download Citation

Gian Piero Banfi, Vittorio Degiorgio, A. R. Rennie, and Giancarlo C. Righini "Measurement of the sizes of the semiconductor crystallites in colored glasses through neutron scattering", Proc. SPIE 1361, Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization, (1 March 1991); https://doi.org/10.1117/12.24307

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