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1 February 1991 Infrared detector arrays with integrating cryogenic read-out electronics
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Proceedings Volume 1362, Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications; (1991) https://doi.org/10.1117/12.24454
Event: Physical Concepts of Materials for Novel Optoelectronic Device Applications, 1990, Aachen, Germany
Abstract
Depending on the application different types of integrating cryogenic read out electronics are used for extrinsic photoconductive detectors and detector arrays. They integrate the current flowing through the detector during a given integration time by charging a capacity. To test the different detector units with respect to their sensitivity different evaluation methods are used for the determination of the noise produced by the whole assembly. To evaluate its amount different methods of signal processing as non destructive read out (NDR), correlated double sampling (CDS) and data averaging are implemented. The different methods of signal and data processing used for the tests of the detector units as well as results obtained at selected detector assemblies are presented and discussed.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Detlef Engemann, Rudolf Faymonville, Rainer Felten, and Otto Frenzl "Infrared detector arrays with integrating cryogenic read-out electronics", Proc. SPIE 1362, Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications, (1 February 1991); https://doi.org/10.1117/12.24454
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