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1 April 1991 Dispersion of picosecond pulses propagating on microstrip interconnections on semiconductor integrated-circuit substrates
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Abstract
A weighted residual formulation for the transverse electric field is presented for the finite-element analysis of microstrip transmission lines on semiconductor substrates. The frequency dependence of the effective dielectric constant and the attenuation constant of the transmission lines are examined. The results from the full-wave analysis are used to determine when a quasi-TEM analysis is applicable.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael F. Pasik, Andreas C. Cangellaris, and John L. Prince "Dispersion of picosecond pulses propagating on microstrip interconnections on semiconductor integrated-circuit substrates", Proc. SPIE 1389, Microelectronic Interconnects and Packages: Optical and Electrical Technologies, (1 April 1991); https://doi.org/10.1117/12.25531
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