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1 June 1991 Life test of high-power Matsushita BTRS laser diodes
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Proceedings Volume 1417, Free-Space Laser Communication Technologies III; (1991)
Event: Optics, Electro-Optics, and Laser Applications in Science and Engineering, 1991, Los Angeles, CA, United States
Results of a 15,000-hr life test of Matsushita BTRS lasers operating at 70-mW peak output power under 50 percent duty cycle pulse modulations are presented. Twenty-two lasers were tested in three temperature groups to provide accelerated aging. Evidence of two different failure mechanisms affecting the lasers was found. Devices tested at 20 C exhibited an unexpectedly high failure rate compared to devices tested at 40 and 70 C, but still had a median lifetime in this test of 11,900 hr. All failed devices from the 20-C group showed facet damage, while no facet damage was seen on failed devices from the other two temperature groups. A median lifetime of 85,000 hr at a 20-C operating temperature is predicted.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Terry L. Holcomb "Life test of high-power Matsushita BTRS laser diodes", Proc. SPIE 1417, Free-Space Laser Communication Technologies III, (1 June 1991);


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