Application of the Ronchi ruling beam profiling method to axially symmetric laser beams

Robert M. O'Connell

doi:10.1117/12.2294427

1 November 1990 Application of the Ronchi ruling beam profiling method to axially symmetric laser beams

Robert M. O'Connell

Author Affiliations +

Proceedings Volume 1438, Laser-Induced Damage in Optical Materials 1989; 14380I (1990) https://doi.org/10.1117/12.2294427
Event: Laser-Induced Damage in Optical Materials 1989, 1989, Boulder, CO, United States

Abstract

The application of the Ronchi ruling beam characterization method to axially symmetric optical beams is analyzed. Specific results are derived for the Airy and focused annulus diffraction patterns. Plots of the ratio of minimum to maximum transmitted optical power versus the first null radius of the beam functions show that for the Airy pattern and other focused annuli with obscuration ratios smaller than approximately 0.30, the method should be just as useful as with Gaussian beams.

Citation Download Citation

Robert M. O'Connell "Application of the Ronchi ruling beam profiling method to axially symmetric laser beams", Proc. SPIE 1438, Laser-Induced Damage in Optical Materials 1989, 14380I (1 November 1990); https://doi.org/10.1117/12.2294427

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