Paper
1 June 1991 Thermal analysis of multifacet-mirror ring resonator for XUV free-electron lasers
Brian D. McVey, John C. Goldstein, Robert D. McFarland, Brian Emerson Newnam
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Abstract
xUv (10 nm -100 nm) free-electron lasers (EELs) are potentially important light sources for advanced lithography and materials applications. The average power of an XUV EEL oscillator may be urnited by thermal loading of the resonator mirrors. We analyze the requirements for the thennal performance of the mirrors of a metal multifacet-mirror ring resonator for use at 12 nm. We use analytical methods and numerical approaches which include simulations with the 3-D EEL code FELEX. Thermal distortion of mirror surfaces leads to optical wavefront aberrations which reduce the focusability of the light beam in the gain medium (wiggler/electron beam) and limit the laser performance.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian D. McVey, John C. Goldstein, Robert D. McFarland, and Brian Emerson Newnam "Thermal analysis of multifacet-mirror ring resonator for XUV free-electron lasers", Proc. SPIE 1441, Laser-Induced Damage in Optical Materials: 1990, (1 June 1991); https://doi.org/10.1117/12.57237
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Mirrors

Resonators

Distortion

Free electron lasers

Extreme ultraviolet

Oscillators

Thermography

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