Investigation of higher-order diffraction in a one-crystal 2-D scanner

Nathan T. Melamed; Milton S. Gottlieb

doi:10.1117/12.28046

1 February 1991 Investigation of higher-order diffraction in a one-crystal 2-D scanner

Nathan T. Melamed, Milton S. Gottlieb

Proceedings Volume 1454, Beam Deflection and Scanning Technologies; (1991) https://doi.org/10.1117/12.28046
Event: Electronic Imaging '91, 1991, San Jose, CA, United States

Abstract

A one-crystal 2-D scanner using the circular birefringence of tellurium dioxide was designed, built, and characterized. A scan angle of approximately 4 to 5 degrees was obtained along each axis for an acoustic frequency range of about 30 to 80 MHz. The intensities of the higher order beams were in the range of 10-2 to 10-4 relative to the first order intensity. The intensity of the second order beam was studied as a function of transducer length and frequency. The authors found a rough agreement based on (1) the diffraction spread of the acoustic beam, and (2) the slope of (theta) i vs frequency, d(theta) i/df, which is a measure of the tolerance of the input beam angle phase matching conditions to small angular deviations.

Citation Download Citation

Nathan T. Melamed and Milton S. Gottlieb "Investigation of higher-order diffraction in a one-crystal 2-D scanner", Proc. SPIE 1454, Beam Deflection and Scanning Technologies, (1 February 1991); https://doi.org/10.1117/12.28046

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