Paper
1 March 1991 Real-time temperature measurement on PCB:s, hybrids, and microchips
Bo Wallin
Author Affiliations +
Abstract
Over the last years thermographic methods have gained considerable ground for temperature measurement on electronic components like PCB:s, hybrids and microchips and quite a large number of articles and lectures have been published. Very little consideration has, however, been devoted to the fact, that the very uneven distribution of the emissivity over the PCB, hybrid or microchip to be measured implies that true temperature measurement cannot take place without special efforts in the form of hardware as well as software tools. The paper describes a method for true temperature measurement on PCB:s and microchips, with consideration to the varying emissivity over the field of view. It also describes a method for true temperature measurement on PCB:s in a rack or a box, where they are hidden for direct thermographic inspection. True temperature measurement on microscopic objects like transistors form another type of object, which demands special measurement hardware and extensive image processing to get the correct temperatures.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bo Wallin "Real-time temperature measurement on PCB:s, hybrids, and microchips", Proc. SPIE 1467, Thermosense XIII, (1 March 1991); https://doi.org/10.1117/12.46435
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Temperature metrology

Microscopes

Image processing

Cameras

Infrared cameras

Infrared imaging

Transistors

Back to Top