Translator Disclaimer
1 March 1991 Automatic method for inspecting plywood shear samples
Author Affiliations +
A plywood panel is composed of several layers of wood bonded together by glue. The adhesive integrity of the glue formulation employed must surpass the structural integrity of wood used to make the panel. The American Plywood Association (APA) regularly tests plywood from manufacturing plants to ensure that this performance requirement is met. One of the procedures used is to saw a panel into a number of 1 X 3- 1/4 inch blocks called samples. These samples are then subjected to a number of treatments to simulate natural aging. The treated samples are then sheared into two halves. A 1 X 1 inch area on each of the two halves is then visually inspected to determine the percent wood failure that occurred during the shear. Roughly speaking a region of solid wood or a region of wood fibers embedded in glue is considered to be a region of wood failure while a region of glue is considered to be a region of glue failure. If the percent wood failure of sample from a significant number or panels from a plant is too low, the right to use the APA trademarks is withdrawn. The number of samples inspected annually by the APA is in the millions. The human inspectors are well trained, typically having years of experience, and are regularly tested. As in any human endeavor, the inspectors are subject to fatigue, boredom, etc. For these and other reasons an automatic inspection system could aid the APA in better performing its regulatory role.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Richard Avent III and Richard W. Conners "Automatic method for inspecting plywood shear samples", Proc. SPIE 1468, Applications of Artificial Intelligence IX, (1 March 1991);


An Overview Of Computer Vision
Proceedings of SPIE (March 29 1988)
Parallel Algorithms For Real-Time Vision
Proceedings of SPIE (April 30 1987)
The Role Of The Image Analyst In Computer Vision
Proceedings of SPIE (June 14 1984)

Back to Top