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1 September 1991 Sine wave measurements of SPRITE detector MTF
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Abstract
A method is presented for measuring the modulation transfer function of SPRITE detectors with a HgCdTe composition optimized for the 3-5 micron band. This method incorporates a 3.39-micron HeNe laser to generate Young's fringes of varying spatial frequency, which are scanned across the detector elements. The results are consistent with theoretical models for these devices and indicate a limited resolution capability for SPRITEs used for the 3-5 micron band.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenneth J. Barnard, Glenn D. Boreman, Allen E. Plogstedt, and Barry K. Anderson "Sine wave measurements of SPRITE detector MTF", Proc. SPIE 1488, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing II, (1 September 1991); https://doi.org/10.1117/12.45823
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