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7 December 1978 Scanning Electron Microscope Readout Of Photographic Film
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As part of an overall program to develop techniques for the intensification of severely underexposed photographic negatives, a technique involving the use of a scanning electron microscope (SEM) to scan the film and display the electron beam scattering intensity on a CRT was investigated. While the program was curtailed before the technique could be fully evaluated, the ability to enhance underexposed film by the equivalent of 5 stops a factor of 32 was demonstrated. This compares favorably with other techniques being investigated, such as autoradiographic sensitization. The SEM technique has the further advantages of being real-time, maintaining the high resolution of the original negative, and being nondestructive. In addition to the above mentioned application, this technique has promise as a convenient means of scanning photographic images for digitization and signal processing.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mitchell W. Millman "Scanning Electron Microscope Readout Of Photographic Film", Proc. SPIE 0149, Digital Image Processing II, (7 December 1978);

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