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1 September 1991 Bidirectional transmittance distribution function measurements on ZnSe and on ZnS Cleartran
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In the present paper the optical transmittive properties of different thickness CVD ZnSe and CVD ZnS Cleartran samples are analyzed using BTDF at the He-Ne laser wavelength. The measurements obtained determine the combined surface and bulk scattering. Surface scatter dominates over bulk scattering for ZnSe, while for ZnS Cleartran the main contribution to the scattered field is given by the bulk. A criteria to assess the material thickness as a function of its scattering characteristics when it is used to realize multispectral imaging system windows is discussed. The results suggest that the thickness of ZnS Cleartran windows in a multispectral imaging system must not exceed few millimeters.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mauro Melozzi, Alessandro Mazzoni, and Gianfranco Curti "Bidirectional transmittance distribution function measurements on ZnSe and on ZnS Cleartran", Proc. SPIE 1512, Infrared and Optoelectronic Materials and Devices, (1 September 1991);

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