Paper
1 November 1991 Microstructure of titanium oxide thin films
Rui-Ying Fan, Yue Mei Lu, Xiangyun Song
Author Affiliations +
Proceedings Volume 1519, International Conference on Thin Film Physics and Applications; (1991) https://doi.org/10.1117/12.47278
Event: International Conference on Thin Film Physics and Applications, 1991, Shanghai, China
Abstract
Reported here are the TEM studies about the microstructures of TiO2 and Ti3O5 thin films thermally annealed at different temperatures and the microstructure change of TiO2 thin films before and after the laser-induced damage. Cross sectional TEM images of IAD deposited TiO2 singlelayer and TiO2/SiO2 multilayers are also observed and analyzed.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rui-Ying Fan, Yue Mei Lu, and Xiangyun Song "Microstructure of titanium oxide thin films", Proc. SPIE 1519, International Conference on Thin Film Physics and Applications, (1 November 1991); https://doi.org/10.1117/12.47278
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KEYWORDS
Thin films

Titanium

Diffraction

Annealing

Laser induced damage

Multilayers

Physics

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