Superconductivity and structural changes of Ar ion-implanted YBa2Cu3O7-x thin films

Yi Jie Li; Cong Xin Ren; Guo Liang Chen; Jian Min Chen; Shichang Zou

doi:10.1117/12.47291

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1 November 1991 Superconductivity and structural changes of Ar ion-implanted YBa₂Cu₃O_7-x thin films

Yi Jie Li, Cong Xin Ren, Guo Liang Chen, Jian Min Chen, Shichang Zou

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Proceedings Volume 1519, International Conference on Thin Film Physics and Applications; (1991) https://doi.org/10.1117/12.47291
Event: International Conference on Thin Film Physics and Applications, 1991, Shanghai, China

Abstract

The effects of Ar ion implantation on superconductivity and structural changes in epitaxial YBa₂Cu₃O_7-x thin films have been studied using x-ray diffraction, scattering electron microscopy (SEM), and transmission electron microscopy (TEM). It was found that both the critical current density J_c and the superconducting transition temperature T_c significantly decreased with the fluence. The sample went through the metal to semiconductor to insulator transitions with the increase of fluence. The TEM images showed that the sample implanted with high fluence became amorphous.

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Yi Jie Li, Cong Xin Ren, Guo Liang Chen, Jian Min Chen, and Shichang Zou "Superconductivity and structural changes of Ar ion-implanted YBa₂Cu₃O_7-x thin films", Proc. SPIE 1519, International Conference on Thin Film Physics and Applications, (1 November 1991); https://doi.org/10.1117/12.47291

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