Submerged reflectance measurements as a function of visible wavelength

John W. Giles; Kenneth John Voss

doi:10.1117/12.48878

1 December 1991 Submerged reflectance measurements as a function of visible wavelength

John W. Giles, Kenneth John Voss

Proceedings Volume 1537, Underwater Imaging, Photography, and Visibility; (1991) https://doi.org/10.1117/12.48878
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

Submerged spectral reflectance measurements made on paint samples using two different techniques are compared. With the first technique spectral measurements are made with a simple thin water film measurement technique originally used for photopic viewing. A comparison of these measurements with a second technique in which the measured sample is immersed in water in a cylindrical container and the submerged reflectance is measured with a goniophotometer shows good agreement for wavelengths from 420 to 700 nm.

Citation Download Citation

John W. Giles and Kenneth John Voss "Submerged reflectance measurements as a function of visible wavelength", Proc. SPIE 1537, Underwater Imaging, Photography, and Visibility, (1 December 1991); https://doi.org/10.1117/12.48878

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