Paper
1 January 1992 Cosmic x-ray spectroscopy with multilayer optics
Arthur B. C. Walker II, Dennis S. Martinez-Galarce, Elizabeth S. Paris, Richard B. Hoover, Troy W. Barbee Jr.
Author Affiliations +
Abstract
Multilayer optics operated at normal incidence offer a powerful new technology for the study of the solar spectrum in the XUV. The spectra of most cosmic X-ray sources are strongly extinguished at wavelengths above 40 A due to absorption and scattering by interstellar grains. We describe a number of configurations which allow multilayer optics to be used at nonnormal angles of incidence in conjunction with grazing incidence optics to analyze the spectra of cosmic X-ray sources in the wavelength interval between 1.5 and 40 A. These optical configurations utilize both multilayer mirrors and gratings, and permit the efficient observation of extended sources using stigmatic spectrographs. The response of the instruments described to typical cosmic X-ray sources is also discussed.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Arthur B. C. Walker II, Dennis S. Martinez-Galarce, Elizabeth S. Paris, Richard B. Hoover, and Troy W. Barbee Jr. "Cosmic x-ray spectroscopy with multilayer optics", Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); https://doi.org/10.1117/12.51252
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KEYWORDS
Crystals

Spectroscopy

Mirrors

X-rays

X-ray optics

Grazing incidence

Telescopes

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