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1 January 1992 Feasibility study of the use of synchrotron radiation in the calibration of AXAF: initial reflectivity results
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Abstract
The 1-percent calibration accuracy goal of the Advanced X-ray Astrophysics Facility is being approached by way of an experiment at the National Synchrotron Light Source that will demonstrate the accuracy achievable in reflectance measurements conducted on coated flat mirrors in the 50 eV-12 keV energy range. The coatings will be of commercially produced Au, Ni, and Ir, deposited either by sputtering or by e-beam deposition. Optical constants will be estimated via the reflectance vs. angle-of-incidence method.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dale E. Graessle, Roger J. V. Brissenden, J. C. Cobuzzi, John P. Hughes, Edwin M. Kellogg, Fred E. Mootz, Daniel A. Schwartz, Patrick O. Slane, Martin V. Zombeck, Richard L. Blake, and Jeffrey C. Davis "Feasibility study of the use of synchrotron radiation in the calibration of AXAF: initial reflectivity results", Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); https://doi.org/10.1117/12.51222
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