Paper
1 October 1991 Performance of a variable-line-spaced master reflection grating for use in the reflection grating spectrometer on the x-ray multimirror mission
Jay V. Bixler, Charles J. Hailey, C. W. Mauche, Peter F. Teague, Robert S. Thoe, Steven M. Kahn, Frits B. S. Paerels
Author Affiliations +
Abstract
The X Ray Multimirror Mission will include a spectrometer consisting of two arrays of variable line-spaced reflection gratings for use in the 350 eV to 2.5 keV energy range. Approximately 720 replica gratings will be needed for two flight grating arrays and one spare. Evaluation of potential master gratings to be used in the replication process has begun. Both reflectivity and scattering x-ray measurements for three mechanically ruled prototype master gratings have been reported.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jay V. Bixler, Charles J. Hailey, C. W. Mauche, Peter F. Teague, Robert S. Thoe, Steven M. Kahn, and Frits B. S. Paerels "Performance of a variable-line-spaced master reflection grating for use in the reflection grating spectrometer on the x-ray multimirror mission", Proc. SPIE 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (1 October 1991); https://doi.org/10.1117/12.48358
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Cited by 4 scholarly publications.
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KEYWORDS
X-rays

Copper

X-ray astronomy

Scattering

Light scattering

Scatter measurement

Extreme ultraviolet

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