Uniformity and transmission of proportional counter window materials for use with AXAF

Kathryn A. Flanagan; Gerald K. Austin; J. C. Cobuzzi; Richard E. Goddard; John P. Hughes; Edward McLaughlin; William A. Podgorski; Vincent D. Rose; Adrian G. Roy; Martin V. Zombeck; Thomas H. Markert; James M. Bauer; Takashi Isobe; Mark L. Schattenburg

doi:10.1117/12.48356

1 October 1991 Uniformity and transmission of proportional counter window materials for use with AXAF

Kathryn A. Flanagan, Gerald K. Austin, J. C. Cobuzzi, Richard E. Goddard, John P. Hughes, Edward McLaughlin, William A. Podgorski, Vincent D. Rose, Adrian G. Roy, Martin V. Zombeck, Thomas H. Markert, James M. Bauer, Takashi Isobe, Mark L. Schattenburg

Author Affiliations +

Proceedings Volume 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II; (1991) https://doi.org/10.1117/12.48356
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

The X-ray detection system used to calibrate the Advanced X-ray Astrophysics Facility (AXAF) mirrors will include gas flow and sealed proportional counters. To meet the ultimate 1 percent goal of the calibration project, the transmission and uniformity of the windows must be well known for the soft X-ray wavelengths involved. Various window materials for use with proportional counters are examined for transmission at X-ray wavelengths in the range of 0.1 to 5.9 keV. These include the usual window materials (polypropylene and beryllium), as well as materials only recently employed for detector applications (polyimide and diamond). The transmission uniformity of beryllium at 1.49 keV is examined with a microchannel plate detector, producing a 'shadowgraph' of the window material illuminated with soft X-rays. This technique allows us to investigate nonuniformities on a spatial scale of about .2 mm.

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Kathryn A. Flanagan, Gerald K. Austin, J. C. Cobuzzi, Richard E. Goddard, John P. Hughes, Edward McLaughlin, William A. Podgorski, Vincent D. Rose, Adrian G. Roy, Martin V. Zombeck, Thomas H. Markert, James M. Bauer, Takashi Isobe, and Mark L. Schattenburg "Uniformity and transmission of proportional counter window materials for use with AXAF", Proc. SPIE 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (1 October 1991); https://doi.org/10.1117/12.48356

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KEYWORDS

X-rays

Beryllium

Sensors

Diamond

Calibration

X-ray detectors

Copper

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