Spacially periodical stress method for measuring the beat length of a highly birefringent optical fiber

Zhongxian Zhang; Hang Gao; Zhilin Nan

doi:10.1117/12.50056

1 August 1991 Spacially periodical stress method for measuring the beat length of a highly birefringent optical fiber

Zhongxian Zhang, Hang Gao, Zhilin Nan

Proceedings Volume 1572, International Conference on Optical Fibre Sensors in China OFS(C) '91; (1991) https://doi.org/10.1117/12.50056
Event: International Conference on Optical Fibre Sensors in China, 1991, Wuhan, China

Abstract

A spatially periodical stress method for measuring the beat length of a highly birefringent fiber has been demonstrated. The relationship between the number of spatially stressed ridges N, the rotation angle (theta) induced by spatially periodical stress, the error of periodical length, and the measuring accuracy is presented. Theoretical and experimental results show the measuring range from 1 submillimeter to 1 cm with an accuracy of the order of 1%.

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Zhongxian Zhang, Hang Gao, and Zhilin Nan "Spacially periodical stress method for measuring the beat length of a highly birefringent optical fiber", Proc. SPIE 1572, International Conference on Optical Fibre Sensors in China OFS(C) '91, (1 August 1991); https://doi.org/10.1117/12.50056

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KEYWORDS

Optical fibers

Polarization

Birefringence

Energy coupling

Sensors

Wave plates

Glasses

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