In-situ characterization by FT-Raman spectroscopy of compounds separated on a thin layer chromatography plate

Peter Fredericks; Christopher de Bakker; Eric Martinez

doi:10.1117/12.56350

1 March 1992 In-situ characterization by FT-Raman spectroscopy of compounds separated on a thin layer chromatography plate

Peter Fredericks, Christopher de Bakker, Eric Martinez

Author Affiliations +

Proceedings Volume 1575, 8th Intl Conf on Fourier Transform Spectroscopy; (1992) https://doi.org/10.1117/12.56350
Event: Eighth International Conference on Fourier Transform Spectroscopy, 1991, Lubeck-Travemunde, Germany

Abstract

FT-Raman spectroscopy has been shown to be useful as a method of identifying compounds separated on a tlc plate. Commercial tlc plates, with or without UV fluorescent indicators, were found to be suitable for the technique provided that they had a metallic backing. Plates with polymer backing were unsuitable, as polymer bands could be seen in the spectrum. The method was demonstrated using a range of aromatic and aliphatic organic compounds.

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Peter Fredericks, Christopher de Bakker, and Eric Martinez "In-situ characterization by FT-Raman spectroscopy of compounds separated on a thin layer chromatography plate", Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); https://doi.org/10.1117/12.56350

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