Infrared properties of a- and c-oriented epitaxial YBCO films

A. N. Ivlev

doi:10.1117/12.2297727

1 October 1991 Infrared properties of a- and c-oriented epitaxial YBCO films

A. N. Ivlev

Proceedings Volume 1576, 16th International Conference on Infrared and Millimeter Waves; 15760E (1991) https://doi.org/10.1117/12.2297727
Event: 16th International Conference on Infrared and Millimeter Waves, 1991, Lausanne, Switzerland

Abstract

Two YBCO oriented epitaxial films on SrTiO₃ substrates prepared by laser ablation technique were used for mid-infrared optical Investigations. Both ac-ori rented (i.e. a^→ (or b^→) and c^→ lattice vectors lie in the substrate plane) and a^→b^→-oriented films were deposited and annealed at the same technological cycle and had thickness about 4000A. Special attention was paid to the determination of quality and orientation. X-rays difraction showed only presence of 00n peaks for (ab)-orientation and 110, 220 peaks for (ac)-film. Lattice constants from X-rays measurements were used to calculate the oxigen contents of films by empyrical formula 7−δ=76.4−5.95⋅c^→ [A], which gives δ≈0.08+0.12.

Citation Download Citation

A. N. Ivlev "Infrared properties of a- and c-oriented epitaxial YBCO films", Proc. SPIE 1576, 16th International Conference on Infrared and Millimeter Waves, 15760E (1 October 1991); https://doi.org/10.1117/12.2297727

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