Characterization of planar optical waveguides by K+ ion exchange in glass at 1.152 and 1.523 um

Gar Lam Yip; Kiyoshi Kishioka; Feng Xiang; J. Y. Chen

doi:10.1117/12.50870

1 December 1991 Characterization of planar optical waveguides by K⁺ ion exchange in glass at 1.152 and 1.523 μm

Gar Lam Yip, Kiyoshi Kishioka, Feng Xiang, J. Y. Chen

Proceedings Volume 1583, Integrated Optical Circuits; (1991) https://doi.org/10.1117/12.50870
Event: OE Fiber, 1991, Boston, MA, United States

Abstract

The WKB relation and mode indices measurement have been used to determine the important surface index change and effective depth of planar K+-ion exchanged waveguides in soda-lime glass at 1.152 and 1.523 mm for any given set of fabrication temperature and time, whereas the substrate index can be determined by a multi-layer Brewster angle measurement. The data obtained are important in the design and fabrication of K+-ion exchanged waveguides in single-mode fiber systems at 1.3 and 1.55 pm.

Citation Download Citation

Gar Lam Yip, Kiyoshi Kishioka, Feng Xiang, and J. Y. Chen "Characterization of planar optical waveguides by K⁺ ion exchange in glass at 1.152 and 1.523 μm", Proc. SPIE 1583, Integrated Optical Circuits, (1 December 1991); https://doi.org/10.1117/12.50870

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