Simple and accurate technique to determine substrate indices by the multilayer Brewster angle measurement

Feng Xiang; Gar Lam Yip

doi:10.1117/12.50897

1 December 1991 Simple and accurate technique to determine substrate indices by the multilayer Brewster angle measurement

Feng Xiang, Gar Lam Yip

Author Affiliations +

Proceedings Volume 1583, Integrated Optical Circuits; (1991) https://doi.org/10.1117/12.50897
Event: OE Fiber, 1991, Boston, MA, United States

Abstract

A reflected light by a substrate becomes zero when H-polarized light is incident at the Brewster angle. Stacking many identical substrates together forms a multi-layer structure. The valley of this reflected intensity pattern centered at the Brewster angle becomes narrower due to the overlapping of these similar reflections from many parallel interfaces of air and substrates. Thus, measuring the Brewster angle of this multi-layer structure leads to an accurate determination of the substrate index.

Citation Download Citation

Feng Xiang and Gar Lam Yip "Simple and accurate technique to determine substrate indices by the multilayer Brewster angle measurement", Proc. SPIE 1583, Integrated Optical Circuits, (1 December 1991); https://doi.org/10.1117/12.50897

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