Laser-induced damage threshold comparison of reactive low-voltage ion-plated and e-beam coatings

Robert Chow; Christopher J. Stolz; Frank Rainer; Gary E. Loomis; Karl H. Guenther; Bala Subramanian; X. Q. Hu

doi:10.1117/12.60093

29 July 1992 Laser-induced damage threshold comparison of reactive low-voltage ion-plated and e-beam coatings

Robert Chow, Christopher J. Stolz, Frank Rainer, Gary E. Loomis, Karl H. Guenther, Bala Subramanian, X. Q. Hu

Proceedings Volume 1624, Laser-Induced Damage in Optical Materials: 1991; (1992) https://doi.org/10.1117/12.60093
Event: Laser-Induced Damage in Optical Materials: 1991, 1991, Boulder, CO, United States

Abstract

Single layer coatings of hafnia are included with results obtained with titania, tantala, zirconia and silica. These coatings were deposited by a reactive low voltage ion plating (RLVIP) and conventional reactive e-beam process. Layer thicknesses were optically a A14at 532 nm. The RMS surface roughness changes between the uncoated and coated were on the sub-angstrom level. The spectral transmittance curves demonstrated the material thickness homogeneity aspect of the RLVIP process. Laser damage thresholds were made from high peak power (1.06 .tm and 0.532 jim, 10 ns) and high average power (511 nm and 578 nm) laser damage test facilities. Given a set of coatings from one process, the damage thresholds tended to increase as the refractive index decreased. The e-beam silica coating had the highest damage threshold, exceeding 98 J/cm2 (1.06 jtm, 10 ns, 10 Hz). In addition, the surface absorption and refractive indices of the coatings were measured, and the X-ray diffraction patterns of the hafnia coatings made.

Citation Download Citation

Robert Chow, Christopher J. Stolz, Frank Rainer, Gary E. Loomis, Karl H. Guenther, Bala Subramanian, and X. Q. Hu "Laser-induced damage threshold comparison of reactive low-voltage ion-plated and e-beam coatings", Proc. SPIE 1624, Laser-Induced Damage in Optical Materials: 1991, (29 July 1992); https://doi.org/10.1117/12.60093

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available